IEEE - Institute of Electrical and Electronics Engineers, Inc. - Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST

2018 IEEE 27th Asian Test Symposium (ATS)

Author(s): Senling Wang ; Tomoki Aono ; Yoshinobu Higami ; Hiroshi Takahashi ; Hiroyuki Iwata ; Yoichi Maeda ; Jun Matsushima
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Hefei, China, China
Conference Date: 15 October 2018
Page(s): 155 - 160
ISBN (Electronic): 978-1-5386-9466-4
ISSN (Electronic): 2377-5386
DOI: 10.1109/ATS.2018.00038
Regular:

Multi-cycle Test applies more than one capture cycles during the capture operation which is a promising way to reduce the test volume of Logic-BIST (Logic Built-in Self-Test) based POST (Power-on... View More

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