IEEE - Institute of Electrical and Electronics Engineers, Inc. - Extending Aging Monitors for Early Life and Wear-Out Failure Prevention

2018 IEEE 27th Asian Test Symposium (ATS)

Author(s): Chang Liu ; Eric Schneider ; Matthias Kampmann ; Sybille Hellebrand ; Hans-Joachim Wunderlich
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Hefei, China, China
Conference Date: 15 October 2018
Page(s): 92 - 97
ISBN (Electronic): 978-1-5386-9466-4
ISSN (Electronic): 2377-5386
DOI: 10.1109/ATS.2018.00028
Regular:

Aging monitors can indicate the wear-out phase of a semi-conductor device before it will actually fail, and allow the use of integrated circuits in applications with high safety and reliability... View More

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