IEEE - Institute of Electrical and Electronics Engineers, Inc. - On Flip-Flop Selection for Multi-cycle Scan Test with Partial Observation in Logic BIST

2018 IEEE 27th Asian Test Symposium (ATS)

Author(s): Shigeyuki Oshima ; Takaaki Kato ; Senling Wang ; Yasuo Sato ; Seiji Kajihara
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Hefei, China, China
Conference Date: 15 October 2018
Page(s): 30 - 35
ISBN (Electronic): 978-1-5386-9466-4
ISSN (Electronic): 2377-5386
DOI: 10.1109/ATS.2018.00017
Regular:

Multi-cycle test with partial observation for scan-based logic BIST is known as one of effective methods to improve fault coverage without increase of test time. In the method, the selection of... View More

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