IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Dictionary-Based Test Data Compression Method Using Tri-State Coding

2018 IEEE 27th Asian Test Symposium (ATS)

Author(s): Tian Chen ; Chenxin Lin ; Huaguo Liang ; Fuji Ren
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Hefei, China, China
Conference Date: 15 October 2018
Page(s): 42 - 47
ISBN (Electronic): 978-1-5386-9466-4
ISSN (Electronic): 2377-5386
DOI: 10.1109/ATS.2018.00019
Regular:

With the rapid development of integrated circuit manufacturing processes, the degree of integration of system-on-chip(SoC) has increased dramatically. In this paper, a dictionary-based test data... View More

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