IEEE - Institute of Electrical and Electronics Engineers, Inc. - A New Scheme to Extract PUF Information by Scan Chain

2018 IEEE 27th Asian Test Symposium (ATS)

Author(s): Aijiao Cui ; Wei Zhou ; Gang Qu ; Huawei Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Hefei, China, China
Conference Date: 15 October 2018
Page(s): 104 - 108
ISBN (Electronic): 978-1-5386-9466-4
ISSN (Electronic): 2377-5386
DOI: 10.1109/ATS.2018.00030
Regular:

Physical unclonable function (PUF) has been widely investigated as a potential security primitive. The unexpected and unclonable PUF information usually serves as a unique ID or secret key in... View More

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