IEEE - Institute of Electrical and Electronics Engineers, Inc. - Characterization of Fine-Pixel X-Ray Imaging Detector Array Fabricated by Using Thick Single-Crystal CdTe Layers on Si Substrates Grown by MOVPE

Author(s): Madan Niraula ; Kazuhito Yasuda ; Shintaro Tsubota ; Taiki Yamaguchi ; Junya Ozawa ; Takuro Mori ; Yasunori Agata
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 6
ISSN (Electronic): 1557-9646
ISSN (Paper): 0018-9383
DOI: 10.1109/TED.2018.2883325
Regular:

A novel approach for developing a large area, high-spatial-resolution X-ray imaging detector is presented. This approach uses metal-organic vapor phase epitaxy grown thick single-crystal... View More

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