IEEE - Institute of Electrical and Electronics Engineers, Inc. - Image Classification Using Low Rank Regularized Extreme Learning Machine

Author(s): Qin Li ; Yang Liu ; Shujian Wang ; Quanxue Gao ; Xinbo Gao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2018.2885982
Regular:

Extreme learning machine (ELM), a least-square based learning algorithm, is a competitive machine learning method and provides efficient unified learning solutions for the applications of... View More

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