IEEE - Institute of Electrical and Electronics Engineers, Inc. - Investigation and Modelling of Large Barkhausen Jumps Dynamics in Low-Power Fluxgate Magnetometers

Author(s): E. Weiss ; R. Alimi ; A. Ivry ; E. Fisher
Sponsor(s): IEEE Sensors Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (CD): 2379-9153
ISSN (Electronic): 1558-1748
ISSN (Paper): 1530-437X
DOI: 10.1109/JSEN.2018.2885779
Regular:

Large Barkhausen jumps occur in low power fluxgates output and seriously affect the signal fidelity and therefore the magnetometer functionality. In this work we investigate the occurrence of DC... View More

Advertisement