IEEE - Institute of Electrical and Electronics Engineers, Inc. - Sentiment Analysis Based on Deep Learning and Its Application in Screening for Perinatal Depression

2018 IEEE Third International Conference on Data Science in Cyberspace (DSC)

Author(s): Yong Chen ; Bin Zhou ; Weina Zhang ; Wenjie Gong ; Guangfu Sun
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2018
Conference Location: Guangzhou, China
Conference Date: 18 June 2018
Page(s): 451 - 456
ISBN (Electronic): 978-1-5386-4210-8
DOI: 10.1109/DSC.2018.00073
Regular:

In the specific field of sentiment analysis tasks, traditional machine learning models lack effective attention to certain features. To address this issue, we extracted and classified user emotion... View More

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