IEEE - Institute of Electrical and Electronics Engineers, Inc. - Yield Improvement in Color Filter Manufacturing Using Taguchi Methods and TRIZ’s Substance–Field Analysis

Author(s): Chao-Ton Su ; Feng-Min Su
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2018
Volume: 8
Page(s): 2,198 - 2,212
ISSN (Electronic): 2156-3985
ISSN (Paper): 2156-3950
DOI: 10.1109/TCPMT.2018.2846692
Regular:

Thin-film transistor liquid crystal display (TFT-LCD) has been widely applied to electronic merchandise in daily lives. All panel makers are trying every possible way to produce high-quality... View More

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