IEEE - Institute of Electrical and Electronics Engineers, Inc. - On Local Sensing of Spin Hall Effect in Tungsten Films by Using STM-Based Measurements

Author(s): Ting Xie ; Michael Dreyer ; David Bowen ; Dan Hinkel ; R. E. Butera ; Charles Krafft ; Isaak Mayergoyz
Sponsor(s): IEEE Nanotechnology Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2018
Volume: 17
Page(s): 914 - 919
ISSN (Electronic): 1941-0085
ISSN (Paper): 1536-125X
DOI: 10.1109/TNANO.2018.2821631
Regular:

The spin Hall effect (SHE) in tungsten films has been experimentally studied by using STM-based measurements. These measurements have been performed by using tungsten and iron-coated tungsten... View More

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