IEEE - Institute of Electrical and Electronics Engineers, Inc. - Metallic Glass Microwire Defects Detection Using Dynamic Nanorobotic Control

Author(s): Wanfeng Shang ; Chunbao Wang ; Lihong Duan ; Quanquan Liu ; Zhengzhi Wu
Sponsor(s): IEEE Nanotechnology Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2018
Volume: 17
Page(s): 662 - 665
ISSN (Electronic): 1941-0085
ISSN (Paper): 1536-125X
DOI: 10.1109/TNANO.2018.2793952
Regular:

Metallic glass (MG) microwires are unique material with great potentials for sensor, actuator, biomaterial, etc., owing to its advanced mechanical properties. Yet, the defects on its surface,... View More

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