IEEE - Institute of Electrical and Electronics Engineers, Inc. - Evaluating the Impact of Repetition, Redundancy, Scrubbing, and Partitioning on 28nm FPGA Reliability through Neutron Testing

Author(s): Ogun O. Kibar ; Prashanth Mohan ; Paolo Rech ; Ken Mai
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1558-1578
ISSN (Paper): 0018-9499
DOI: 10.1109/TNS.2018.2885066
Regular:

SRAM-based FPGAs are widely deployed in space and high-radiation environments, but they exhibit vulnerability to radiation effects. Designs can be hardened against radiation effects with... View More

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