IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Versatile CMOS Transistor Array IC for the Statistical Characterization of Time-Zero Variability, RTN, BTI, and HCI

Author(s): Javier Diaz-Fortuny ; Javier Martin-Martinez ; Rosana Rodriguez ; Rafael Castro-Lopez ; Elisenda Roca ; Xavier Aragones ; Enrique Barajas ; Diego Mateo ; Francisco V. Fernandez ; Montserrat Nafria
Sponsor(s): IEEE Solid-State Circuits Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 13
ISSN (Electronic): 1558-173X
ISSN (Paper): 0018-9200
DOI: 10.1109/JSSC.2018.2881923
Regular:

Statistical characterization of CMOS transistor variability phenomena in modern nanometer technologies is key for accurate end-of-life prediction. This paper presents a novel CMOS transistor array... View More

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