IEEE - Institute of Electrical and Electronics Engineers, Inc. - Scatter artifacts removal using Learning-based method for CBCT in IGRT system

Author(s): Shipeng Xie ; Chengyuan Yang ; Zijian Zhang ; Haibo Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2018.2884704
Regular:

Cone-beam computed tomography (CBCT) has shown enormous potential in recent years but is limited by severe scatter artifacts. This study proposes a scatter-correction algorithm based on a deep... View More

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