IEEE - Institute of Electrical and Electronics Engineers, Inc. - Temporary Overvoltage (TOV) Test Values for SPDs in Japan

2018 34th International Conference on Lightning Protection (ICLP)

Author(s): Kensuke Kaito ; Hidetaka Sato ; Yoshinosuke Arai
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2018
Conference Location: Rzeszow, Poland
Conference Date: 2 September 2018
Page(s): 1 - 5
ISBN (Electronic): 978-1-5386-6635-7
ISBN (USB): 978-1-5386-6634-0
DOI: 10.1109/ICLP.2018.8503307
Regular:

In IEC 61643-11:2011 [1], the temporary overvoltage (TOV) test method and test values to confirm the safety of the SPD in TOV are specified. However, this TOV test values is based on the three... View More

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