IEEE - Institute of Electrical and Electronics Engineers, Inc. - A 224 PW 260 PPM/°C Gate-Leakage-Based Timer for Ultra-Low Power Sensor Nodes with Second-Order Temperature Dependency Cancellation

2018 IEEE Symposium on VLSI Circuits

Author(s): Jongyup Lim ; Taekwang Jang ; Mehdi Saligane ; Makoto Yasuda ; Satoru Miyoshi ; Masaru Kawaminami ; David Blaauw ; Dennis Sylvester
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2018
Conference Location: Honolulu, HI, USA
Conference Date: 18 June 2018
Page(s): 117 - 118
ISBN (Electronic): 978-1-5386-4214-6
DOI: 10.1109/VLSIC.2018.8502374
Regular:

A key challenge in the design of on-chip wake-up timers for compact wireless sensor nodes is to achieve high timing accuracy over temperature and supply voltage variation within an ultra-low power... View More

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