IEEE - Institute of Electrical and Electronics Engineers, Inc. - Logic Process Compatible 40NM 16MB, Embedded Perpendicular-MRAM with Hybrid-Resistance Reference, Sub-μA Sensing Resolution, and 17.5NS Read Access Time

2018 IEEE Symposium on VLSI Circuits

Author(s): Yi-Chun Shih ; Chia-Fu Lee ; Yen-An Chang ; Po-Hao Lee ; Hon-Jarn Lin ; Yu-Lin Chen ; Ku-Feng Lin ; Ta-Ching Yeh ; Hung-Chang Yu ; Harry Chuang ; Yu-Der Chih ; Jonathan Chang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2018
Conference Location: Honolulu, HI, USA
Conference Date: 18 June 2018
Page(s): 79 - 80
ISBN (Electronic): 978-1-5386-4214-6
DOI: 10.1109/VLSIC.2018.8502260
Regular:

A new MRAM reference and sensing circuit that can achieve <; ±1μA resolution and 17.5nS read access from -40C to 125C is presented in this paper. A trimmable current-mode latch-type sense... View More

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