IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Digital Bang-Bang Phase-Locked Loop with Background Injection Timing Calibration and Automatic Loop Gain Control in 7NM FinFET CMOS

2018 IEEE Symposium on VLSI Circuits

Author(s): Ting-Kuei Kuan ; Chin-Yang Wu ; Ruei-Pin Shen ; Chih-Hsien Chang ; Kenny Hsieh ; Mark Chen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2018
Conference Location: Honolulu, HI, USA
Conference Date: 18 June 2018
Page(s): 179 - 180
ISBN (Electronic): 978-1-5386-4214-6
DOI: 10.1109/VLSIC.2018.8502365
Regular:

This paper presents a digital bang-bang phase-locked loop that employs background injection timing calibration and automatic loop gain control to enhance the jitter and spur performance against... View More

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