IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault Detection Assessment Architectures based on Classification Methods and Information Fusion

2018 IEEE 23rd International Conference on Emerging Technologies and Factory Automation (ETFA)

Author(s): Fernando Arevalo ; Juan Rernenteria ; Andreas Schwung
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2018
Conference Location: Turin, Italy
Conference Date: 4 September 2018
Volume: 1
Page(s): 1,343 - 1,350
ISBN (Electronic): 978-1-5386-7108-5
ISBN (USB): 978-1-5386-7107-8
ISSN (Electronic): 1946-0759
DOI: 10.1109/ETFA.2018.8502604
Regular:

Classifiers based on machine learning are popular in literature, in order to support predictive maintenance of machinery. Depending on the process data, one classifier can assess target classes... View More

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