IEEE - Institute of Electrical and Electronics Engineers, Inc. - Linear Classification of Badly Conditioned Data

2018 IEEE 23rd International Conference on Emerging Technologies and Factory Automation (ETFA)

Author(s): Helene Dorksen ; Volker Lohweg
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2018
Conference Location: Turin, Italy
Conference Date: 4 September 2018
Volume: 1
Page(s): 654 - 660
ISBN (Electronic): 978-1-5386-7108-5
ISBN (USB): 978-1-5386-7107-8
ISSN (Electronic): 1946-0759
DOI: 10.1109/ETFA.2018.8502485
Regular:

We present a method for the fast and robust linear classification of badly conditioned data. In our considerations, badly conditioned data are such data which are numerically difficult to handle.... View More

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