IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic generation of formal models for diagnosability of DES

2018 IEEE 23rd International Conference on Emerging Technologies and Factory Automation (ETFA)

Author(s): R. Nardone ; G. De Tommasi ; N. Mazzocca ; A. Pironti ; V. Vittorini
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2018
Conference Location: Turin, Italy
Conference Date: 4 September 2018
Volume: 1
Page(s): 43 - 48
ISBN (Electronic): 978-1-5386-7108-5
ISBN (USB): 978-1-5386-7107-8
ISSN (Electronic): 1946-0759
DOI: 10.1109/ETFA.2018.8502565
Regular:

This paper aims at defining a model-driven approach for the diagnosability analysis of discrete event systems (DES). The proposed approach can be adopted during the design of modern control... View More

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