IEEE - Institute of Electrical and Electronics Engineers, Inc. - Keyframe-based Local Normal Distribution Transform Occupancy Maps for Environment Mapping

2018 IEEE 23rd International Conference on Emerging Technologies and Factory Automation (ETFA)

Author(s): Dominik Belter ; Karol Piaskowski ; Rafan Staszak
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2018
Conference Location: Turin, Italy
Conference Date: 4 September 2018
Volume: 1
Page(s): 706 - 712
ISBN (Electronic): 978-1-5386-7108-5
ISBN (USB): 978-1-5386-7107-8
ISSN (Electronic): 1946-0759
DOI: 10.1109/ETFA.2018.8502517
Regular:

In this paper, we propose a new mapping method based on Normal Distribution Transform Occupancy Maps (NDT-OM) for environment exploration. Our goal is to propose a new architecture which can be... View More

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