IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study on Multipactor Breakdown in Coaxial to Microstrip Transitions

2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)

Author(s): Miguel A. Sanchez-Soriano ; Stephan Marini ; Joaquin Vague ; Celia Gomez ; Fernando Quesada ; Alejandro Alvarez ; Vicente E. Boria ; Marco Guglielmi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2018
Conference Location: Reykjavik, Iceland
Conference Date: 8 August 2018
Page(s): 1 - 4
ISBN (Electronic): 978-1-5386-5204-6
ISBN (USB): 978-1-5386-5203-9
DOI: 10.1109/NEMO.2018.8503424
Regular:

The objective of this paper is to study multipactor breakdown in coaxial to microstrip transitions. This kind of transitions generally exhibit a gap just below the central pin of the coaxial... View More

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