IEEE - Institute of Electrical and Electronics Engineers, Inc. - Long-Term Tum-by-Tum Measurements of Electron bunch Profiles at MHz Repetition Rates in a Storage Ring with Single-Shot Electro-Optical Sampling

2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2018)

Author(s): Stefan Funkner ; Miriam Brosi ; Erik Bründermann ; Michele Caselle ; Michael J. Nasse ; Gudrun Niehues ; Lorenzo Rota ; Patrik Schönfeldt ; Marc Weber ; Anke-Susanne Müller
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2018
Conference Location: Nagoya, Japan
Conference Date: 9 September 2018
Page(s): 1 - 2
ISBN (Electronic): 978-1-5386-3809-5
ISBN (USB): 978-1-5386-3808-8
ISSN (Electronic): 2162-2035
DOI: 10.1109/IRMMW-THz.2018.8510080
Regular:

At the KArlsruhe Research Accelerator (KARA), we use electro-optical sampling to measures profiles of compressed electron bunches during the microbunching instability. The observation of the... View More

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