IEEE - Institute of Electrical and Electronics Engineers, Inc. - Capacity-Achieving Codes that Mitigate Intercell Interference and Charge Leakage in Flash Memories

Author(s): Yeow Meng Chee ; Johan Chrisnata ; Han Mao Kiah ; San Ling ; Tuan Thanh Nguyen ; Van Khu Vu
Sponsor(s): IEEE Information Theory Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1557-9654
ISSN (Paper): 0018-9448
DOI: 10.1109/TIT.2018.2884210
Regular:

We investigate constant-composition constrained codes for mitigation of intercell interference for multilevel cell flash memories with dynamic threshold scheme. The first explicit formula... View More

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