IEEE - Institute of Electrical and Electronics Engineers, Inc. - Scalable Large-Margin Distance Metric Learning Using Stochastic Gradient Descent

Author(s): Bac Nguyen ; Carlos Morell ; Bernard De Baets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 12
ISSN (Electronic): 2168-2275
ISSN (Paper): 2168-2267
DOI: 10.1109/TCYB.2018.2881417
Regular:

The key to success of many machine learning and pattern recognition algorithms is the way of computing distances between the input data. In this paper, we propose a large-margin-based approach,... View More

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