IEEE - Institute of Electrical and Electronics Engineers, Inc. - Noisy Adaptive Group Testing: Bounds and Algorithms

Author(s): Jonathan Scarlett
Sponsor(s): IEEE Information Theory Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1557-9654
ISSN (Paper): 0018-9448
DOI: 10.1109/TIT.2018.2883604
Regular:

The group testing problem consists of determining a small set of defective items from a larger set of items based on a number of possibly-noisy tests, and is relevant in applications such as... View More

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