IEEE - Institute of Electrical and Electronics Engineers, Inc. - FUZYE: A Fuzzy C-Means Analog IC Yield Optimization using Evolutionary-based Algorithms

Author(s): Antonio Canelas ; Ricardo Povoa ; Ricardo Martins ; Nuno Lourenco ; Jorge Guilherme ; Joao Paulo Carvalho ; Nuno Horta
Sponsor(s): IEEE Council on Electronic Design Automation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1937-4151
ISSN (Paper): 0278-0070
DOI: 10.1109/TCAD.2018.2883978
Regular:

This paper presents FUZYE, a methodology that reduces the time impact caused by Monte Carlo (MC) simulations in the context of analog integrated circuits (ICs) yield estimation, enabling it for... View More

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