IEEE - Institute of Electrical and Electronics Engineers, Inc. - Data Subset Selection With Imperfect Multiple Labels

Author(s): Meng Fang ; Tianyi Zhou ; Jie Yin ; Yang Wang ; Dacheng Tao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 10
ISSN (Electronic): 2162-2388
ISSN (Paper): 2162-237X
DOI: 10.1109/TNNLS.2018.2875470
Regular:

We study the problem of selecting a subset of weakly labeled data where the labels of each data instance are redundant and imperfect. In real applications, less-than-expert labels are obtained at... View More

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