IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robust Clustered Support Vector Machine with Applications to Modeling of Practical Processes

Author(s): Xinjiang Lu ; Tete Hu ; Yi Zhang ; Bin Fan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2018.2883433
Regular:

Real datasets are often distributed nonlinearly. Although many least squares support vector machine (LS-SVM) methods have successfully modeled this kind of data using a divide-and-conquer... View More

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