IEEE - Institute of Electrical and Electronics Engineers, Inc. - Distribution of controlling volumes of metrological support for the objectives of complex organizational and technical systems with the use of semi-Markov models

2018 Eleventh International Conference "Management of large-scale system development" (MLSD)

Author(s): Khayrullin R. Z ; Popenkov A. J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Moscow, Russia, Russia
Conference Date: 1 October 2018
Page(s): 1 - 4
ISBN (Electronic): 978-1-5386-4924-4
DOI: 10.1109/MLSD.2018.8551917
Regular:

A scientific and methodological approach to the construction of semi-Markov models describing the process of metrological support of special technical systems is presented. A mathematical model... View More

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