IEEE - Institute of Electrical and Electronics Engineers, Inc. - Research on Physical Parameter Measurement System of Fiber Fabry-Perot Interferometer

2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)

Author(s): Yanjun Li ; Wenqi Wu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2018
Conference Location: Hangzhou, China, China
Conference Date: 13 August 2018
Page(s): 377 - 381
ISBN (Electronic): 978-1-5386-6214-4
ISBN (USB): 978-1-5386-6213-7
DOI: 10.1109/3M-NANO.2018.8552199
Regular:

Fiber Fabry-Perot Interferometer (FFPI) is made of two well-cleaved fiber end faces with high-reflectivity, which is widely used in displacement sensing, pressure sensing, acoustic wave and... View More

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