IEEE - Institute of Electrical and Electronics Engineers, Inc. - Optimization of Phase Noise in Digital Holographic Microscopy

2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)

Author(s): Yanan Zeng ; Yuan Liu ; Fan Yang ; Junsheng Lu ; Xinyu Chang ; Xiaodong Hu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2018
Conference Location: Hangzhou, China, China
Conference Date: 13 August 2018
Page(s): 382 - 385
ISBN (Electronic): 978-1-5386-6214-4
ISBN (USB): 978-1-5386-6213-7
DOI: 10.1109/3M-NANO.2018.8552190
Regular:

A phase noise optimizing method was proposed in this paper to improve the imaging quality of digital microscopic holography (DHM). In this method, bidimensional empirical mode decomposition (BEMD)... View More

Advertisement