IEEE - Institute of Electrical and Electronics Engineers, Inc. - Josephson Tunneling Behaviors in NbN/AlN/NbN Junctions with an Ultrathin NbN Film

Author(s): Qiyu Zhang ; Huiwu Wang ; Xin Tang ; Hang Xue ; Wei Peng ; Zhen Wang
Sponsor(s): Council on Superconductivity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2018
Volume: 28
Page(s): 1 - 4
ISSN (CD): 2378-7074
ISSN (Electronic): 1558-2515
ISSN (Paper): 1051-8223
DOI: 10.1109/TASC.2018.2869803
Regular:

We fabricated epitaxial NbN/AlN/NbN tunnel junctions with an ultrathin NbN film as the base layer on single-crystal MgO (100) substrates. The measured thickness of the base layer was 4.7 nm. By... View More

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