IEEE - Institute of Electrical and Electronics Engineers, Inc. - Accurate Defect Detection in Thin-Wall Structures With Transducer Networks via Outlier Elimination

Author(s): Xiang Li ; Shuxue Ding ; Benying Tan
Sponsor(s): IEEE Sensors Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2018
Volume: 18
Page(s): 9,619 - 9,628
ISSN (CD): 2379-9153
ISSN (Electronic): 1558-1748
ISSN (Paper): 1530-437X
DOI: 10.1109/JSEN.2018.2871459
Regular:

For the sake of structural health monitoring for defect detection in thin-wall structures, we present an outlier analysis approach by using robust principal component analysis (Robust PCA) for the... View More

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