IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Bayesian parametric model for quantifying brain maturation from sleep-EEG in the vulnerable newborn baby

2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC)

Author(s): Kirubin Pillay ; Anneleen Dereymaeker ; Katrien Jansen ; Gunnar Naulaers ; Maarten De Vos
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2018
Conference Location: Honolulu, HI, USA
Conference Date: 18 July 2018
Page(s): 1 - 4
ISBN (Electronic): 978-1-5386-3646-6
ISBN (USB): 978-1-5386-3645-9
ISSN (Electronic): 1558-4615
DOI: 10.1109/EMBC.2018.8512185
Regular:

Newborn babies, particularly preterms, can exhibit early deviations in sleep maturation as seen by Electroencephalogram (EEG) recordings. This may be indicative of cognitive problems by... View More

Advertisement