IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Fully Automated System for Sizing Nasal PAP Masks Using Facial Photographs

2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC)

Author(s): Benjamin Johnston ; Philip de Chazal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2018
Conference Location: Honolulu, HI, USA
Conference Date: 18 July 2018
Page(s): 3,979 - 3,982
ISBN (Electronic): 978-1-5386-3646-6
ISBN (USB): 978-1-5386-3645-9
ISSN (Electronic): 1558-4615
DOI: 10.1109/EMBC.2018.8513358
Regular:

We present a fully automated system for sizing nasal Positive Airway Pressure (PAP) masks. The system is comprised of a mix of HOG object detectors as well as multiple convolutional neural network... View More

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