IEEE - Institute of Electrical and Electronics Engineers, Inc. - Lifetime and Degradation of Pre-damaged PV-Modules – Field study and lab testing

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): Claudia Buerhop ; Christoph J. Brabec ; Sven Wirsching ; Simon Gehre ; Tobias Pickel ; Thilo Winkler ; Andreas Bemm ; Julia Mergheim ; Christian Camus ; Jens Hauch
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 3,500 - 3,505
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366096
Regular:

The presence of pre-cracked PV-modules in modern PV-plants is well-known. The evolution and actual impact of the cracks on electrical yield under real operation conditions is not yet understood... View More

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