IEEE - Institute of Electrical and Electronics Engineers, Inc. - Preventing Potential-Induced Degradation in Crystalline Silicon PV Modules: Relationship Between Degradation and Bill of Material

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): Alessandro Virtuani ; Eleonora Annigoni ; Christophe Ballif
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 1,395 - 1,399
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366663
Regular:

In this contribution we investigate the relationship between potential-induced degradation (PID) and the Bill of Material (BOM) used by module manufacturers. The BOM include two types of solar... View More

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