IEEE - Institute of Electrical and Electronics Engineers, Inc. - Correlation of I-V Curve Parameters with Module-Level Electroluminescent Image Data Over 3000 Hours Damp-Heat Exposure

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): Justin S. Fada ; Andrew J. Loach ; Alan J. Curran ; Jennifer L. Braid ; Shuying Yang ; Timothy J. Peshek ; Roger H. French
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 2,697 - 2,701
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366659
Regular:

Four module brands of three samples each were exposed to 3000 hours of accelerated damp-heat testing. Current voltage (I-V) curve tracing and electroluminescent (EL) imaging were performed at 500... View More

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