IEEE - Institute of Electrical and Electronics Engineers, Inc. - Numerical Simulation of EBIC for Analysis of Extended Defects

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): Marco Nardone ; John Moseley ; Saroj Dahal ; Anuja V. Parikh ; John M. Waddle
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 3,123 - 3,128
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366796
Regular:

Electron beam induced current (EBIC) measurements and simulation are employed to better understand recombination at extended defects, such as dislocations, grain boundaries, and stacking faults.... View More

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