IEEE - Institute of Electrical and Electronics Engineers, Inc. - Forecasting Environmental Degradation Power Loss in Solar Panels with a Predictive Crack Opening Test

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): Jason L. Lincoln ; Andrew M. Gabor ; Eric J. Schneller ; Hubert Seigneur ; Joseph Walters ; Rob Janoch ; Andrew Anselmo ; Victor Huayamave ; Winston Schoenfeld
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 2,839 - 2,843
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366573
Regular:

Manufacturing, shipping & handling, installation, and in-field loading of photovoltaic solar panels are common contributors to the creation of cracks within the cells of a panel. Many cracks... View More

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