IEEE - Institute of Electrical and Electronics Engineers, Inc. - PV Module Durability -connecting field results, accelerated testing, and materials

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): T. John Trout ; W. Gambogi ; T. Felder ; K. R. Choudhury ; L. Garreau-Iles ; Y. Heta ; K. Stika
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 2,312 - 2,317
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366321
Regular:

This presentation will discuss the framework employed at DuPont for using the analysis of modules from the field to guide development of accelerated tests and understand aging and degradation of... View More

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