IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Comparison of Si-based Cameras for Imaging Luminescence from Photovoltaic Materials and Devices

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): Steve Johnston
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 459 - 463
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366468
Regular:

Evaluation of soiling loss on PV modules based on field measurements is usually a time consuming and expensive undertaking. A laboratory technique using acetonitrile as a carrier solvent is being... View More

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