IEEE - Institute of Electrical and Electronics Engineers, Inc. - A New Method to Quantify Contact Resistance Using Localized-Illumination Photoluminescence Technique in a Solar Cell

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): Amit Singh Rajput ; Samuel Raj ; Johnson Wong ; Armin G. Aberle
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 499 - 502
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366660
Regular:

An approach to derive the contact resistance of solar cell using localized-illumination photoluminescence (PL) imaging technique is presented. In this work, we used advanced finite-element... View More

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