IEEE - Institute of Electrical and Electronics Engineers, Inc. - Field Inspection of PV Modules: Quantification of EVA Browning Level Using an Image Processing Tool

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): Sushanth Gudla ; GovindaSamy TamizhMani
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 1,389 - 1,394
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366064
Regular:

PV plant inspections are important to identify and quantitatively determine the impacts of various visual defects on module performance. One of the dominant visual defects is EVA (ethylene vinyl... View More

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