IEEE - Institute of Electrical and Electronics Engineers, Inc. - X-Ray Beam Induced Voltage: A Novel Technique for Electrical Nanocharacterization of Solar Cells

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): Michael E. Stuckelberger ; Tara Nietzold ; Bradley M. West ; Barry Lai ; Jorg M. Maser ; Volker Rose ; Mariana I. Bertoni
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 2,179 - 2,184
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366368
Regular:

The efficiency of solar cells with a polycrystalline absorber is typically limited by grain boundaries. Many questions need to be answered such as: which roles do elemental and structural... View More

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