IEEE - Institute of Electrical and Electronics Engineers, Inc. - Photoluminescence-imaging-based Evaluation of Non-uniform CdTe Degradation

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): Steve Johnston ; David Albin ; Peter Hacke ; Steven P. Harvey ; Helio Moutinho ; Mowafak Al-Jassim ; Wyatt K. Metzger
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 3,305 - 3,308
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366452
Regular:

A control algorithm is designed to smooth the variability of PV power output using distributed batteries. The tradeoff between smoothing and battery size is shown. It is also demonstrated that... View More

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