IEEE - Institute of Electrical and Electronics Engineers, Inc. - Nanoscale Detection of Deep Levels in CIGS using Electron Energy Loss Spectroscopy

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): Julia I. Deitz ; Pran K. Paul ; Shankar Karki ; Sylvain Marsillac ; Aaron R. Arehart ; Tyler J. Grassman ; David W. McComb
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 3,139 - 3,142
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366253
Regular:

Correlation of electronic structure with nanoscale chemical and physical structure in photovoltaic (PV) materials can provide a pathway to improve fundamental understanding of the nature and... View More

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